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IJND-1

International Journal of Nano Dimension (Int. J. Nano Dimens.)

Editor-in-Chief: Dr. Khalil Pourshamsian; Director-in-Charge: Dr. Babak Sadeghi

Online ISSN: 2228-5059

Print ISSN: 2008-8868

Publishes Quarterly

Original Article
Numerical optimization of threshold voltage and off-current of a nano-scale symmetric double gate MOSFET based on the genetic algorithm: Various strategies compatible with device applications

In this paper, we optimize the electrical characteristics of Nano-scale symmetric double-gate metal oxide semiconductor field effect transistors (DG-MOSFETs) for digital applications using a genetic algorithm. We use a single-objective genetic algorithm to optimize the threshold voltage (Vth) with a distinct analytical relationship. The optimization of the threshold voltage is accomplished for three cases with […]

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Original Article
A novel lightly doped drain and source Carbon nanotube field effect transistor (CNTFET) with negative differential resistance

In this paper, we propose and evaluate a novel design of a lightly doped drain and source carbon nanotube field effect transistor (LDDS-CNTFET) with a negative differential resistance (NDR) characteristic, called negative differential resistance LDDS-CNTFET (NDR-LDDS-CNTFET). The device was simulated by using a non equilibrium Green’s function method. To achieve this phenomenon, we have created […]

Original Article
Analysis and study of geometrical variability on the performance of junctionless tunneling field effect transistors: Advantage or deficiency?

This study investigates geometrical variability on the sensitivity of the junctionless tunneling field effect transistor (JLTFET) and Heterostructure JLTFET (HJLTFET) performance. We consider the transistor gate dielectric thickness as one of the main variation sources. The impacts of variations on the analog and digital performance of the devices are calculated by using computer aided design […]

Original Article
Representation of a nanoscale heterostructure dual material gate JL-FET with NDR characteristics

In this paper, we propose a new heterostructure dual material gate junctionless field-effect transistor (H-DMG-JLFET), with negative differential resistance (NDR) characteristic. The drain and channel material are silicon and source material is germanium. The gate electrode near the source is larger. A dual gate material technique is used to achieve upward band bending in order […]

Original Article
A design of improved nanoscale U-Shaped TFET by energy band modification for high performance digital and analog/RF applications

In this study, a new nanoscale U-shaped tunnel field-effect transistor (US TFET) structure is proposed. In order to start the design process, the drain region of the conventional US TFET is divided into two distinct parts with N+ and N– doping which is named the drain doping engineering (DDE). It is considered that the tunneling […]