Silver Oxide (AgO) thin films were prepared by using a cylindrical direct current reactive magnetron sputtering system at 10-5 torr initial pressure on BK7 glass substrate. Samples deposited for 3, 5 and 7 minutes. Surface characterization of AgO thin films in the nanometer scale can be accurately determined using the atomic force microscopy (AFM) and […]
AbstractIn this study, the influences of variations in the gas flow rate and incidence angles of argon cold atmospheric-pressure plasma jet on the morphology and absorption spectra of silver thin films (60 nm, 80 nm, and 100 nm film thickness) are investigated. To evaluate the surface morphology, atomic force microscopy (AFM) was employed on the silver thin film […]
