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Keyword: Annealing

Comparing the structural and magnetic properties of FePt/MgO/Si and FePt/Ag/Si granular nanolayers

AbstractThe properties of L10-FePt nanoparticles can be improved in the presence of MgO and Ag interlayers in direct sputtering and annealing method, respectively. Such properties are crystal and compound ordering, nanostructure and crystal orientation. In this work, FePt nanoparticles in ferromagnetic L10-fct phase were synthesized using sputtering method on Ag and MgO layers. According to […]

Structural and optical characterization of ZrO2 thin films grown on silicon and quartz substrates

AbstractZirconium oxide thin films were grown successfully by thermal annealing of zirconium thin films deposited on quartz and silicon substrates by direct current magnetron sputtering technique. The structural and optical properties in relation to thermal annealing times were investigated. The X-ray diffraction patterns revealed that structure of films changes from amorphous to crystalline by increase […]

On the corrosion resistance of AISI 316L-type stainless steel coated with manganese and annealed with flow of oxygen

AbstractAISI 316L-type stainless steel was coated with 300-nm-thick Mn thin films and post-annealed at 673 K with a constant flow of oxygen (250 cm3/min). The films crystallographic and morphological structures were analyzed using X-ray diffraction (XRD) and atomic force microscopy (AFM) before corrosion test and scanning electron microscopy (SEM) after corrosion test. Corrosion behavior of the samples […]

The effect of varying temperature and O2 flow rate in ex situ annealed tin-doped indium for fabrication of commercial grade indium tin oxide

AbstractIn this work, tin-doped indium was deposited on a glass substrate via the electron beam evaporation technique. Then, the as-grown thin films were baked in the presence of oxygen at different O2 flow rates and temperatures inside a furnace to obtain transparent conducting oxide thin film structures. The electrical and optical properties of the layers […]