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Keyword: Atomic force Microscopy (AFM)

Original Article
Analytical methods for nanomaterial characterization

In recent years, it has become evident that it is necessary to systematically and accurately define particle characteristics in order to understand the potential toxicity of nanoparticles to biological systems. The properties that need to be emphasized are size, shape, dispersion, doping, aggregation, functionalization, physical and chemical properties, surface area, and surface chemistry. Route of […]

Original Article
Change of diffused and scattered light with surface roughness of p-type porous Silicon

Porous silicon samples were prepared by electrochemical etching method for different etching times. The structural properties of porous silicon (PS) samples were determined from the Atomic Force Microscopy (AFM) measurements. The surface mean root square roughness (σ rms) changes as function of porosity were studied, and the influence of etching time on porosity and roughness […]