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Keyword: Atomic force microscope

Original Article
Sensitivity analysis of a caliper formed atomic force microscope cantilever based on a modified couple stress theory

A relationship based on the modified couple stress theory is developed to investigate the flexural sensitivity of an atomic force microscope (AFM) with assembled cantilever probe (ACP). This ACP comprises a horizontal cantilever, two vertical extensions and two tips located at the free ends of the extensions which form a caliper. An approximate solution to […]