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IJND-1

International Journal of Nano Dimension (Int. J. Nano Dimens.)

Editor-in-Chief: Dr. Khalil Pourshamsian; Director-in-Charge: Dr. Babak Sadeghi

Online ISSN: 2228-5059

Print ISSN: 2008-8868

Publishes Quarterly

Original Article
Determination of porous Silicon thermal conductivity using the “Mirage effect” method

Mirage effect is contactless and non destructive method which has been used a lot to determine thermal properties of different  kind of samples , transverse photothermal deflection PTD in  skimming configuration with ccd camera  and special programs is used to determine thermal conductivity of porous silicon ps  film. Ps samples were prepared by electrochemical etching. […]