Porous silicon samples were prepared by electrochemical etching method for different etching times. The structural properties of porous silicon (PS) samples were determined from the Atomic Force Microscopy (AFM) measurements. The surface mean root square roughness (σ rms) changes as function of porosity were studied, and the influence of etching time on porosity and roughness […]
Mirage effect is contactless and non destructive method which has been used a lot to determine thermal properties of different kind of samples , transverse photothermal deflection PTD in skimming configuration with ccd camera and special programs is used to determine thermal conductivity of porous silicon ps film. Ps samples were prepared by electrochemical etching. […]
