skip to main content
Menu
IJND-1

International Journal of Nano Dimension (Int. J. Nano Dimens.)

Editor-in-Chief: Dr. Khalil Pourshamsian; Director-in-Charge: Dr. Babak Sadeghi

Online ISSN: 2228-5059

Print ISSN: 2008-8868

Publishes Quarterly

Original Article
Studying of various nanolithography methods by using Scanning Probe Microscope

The Scanning Probe Microscopes (SPMs) based lithographic techniques have been demonstrated as an extremely capable patterning tool. Manipulating surfaces, creating atomic assembly, fabricating chemical patterns, imaging topography and characterizing various mechanical properties of materials in nanometer regime are enabled by this technique. In this paper, a qualified overview of diverse lithographical methods mostly based on […]

Original Article
An overview of scanning near-field optical microscopy in characterization of nano-materials

Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In […]

Original Article
Facile and economic method for preparation of nano-colloidal Silica with controlled size and stability

This study is focused on synthesis of nano-colloidal silica via alkaline water glass solution. Sodium ions of water glass were removed by cation exchanging in a resin column to obtain the silicic acid which was titrated to the solution of sodium silicate. Concentration of the colloidal silica and pH value of the solutions were controlled […]