10.7508/ijnd.2014.03.008

Determination of porous Silicon thermal conductivity using the âMirage effectâ method

HTML
  • F. Alfeel1,
  • F. Awad1,
  • F. Qamar1,
  1. Department of Physics, Science Faculty, Damascus University, Syria.

Published in Issue 2024-02-29

How to Cite

Alfeel, F., Awad, F., & Qamar, F. (2024). Determination of porous Silicon thermal conductivity using the “Mirage effect” method. International Journal of Nano Dimension, 5(3). https://doi.org/10.7508/ijnd.2014.03.008
Crossref
Scopus
Google Scholar
Europe PMC

HTML views: 5

Abstract

Mirage effect is contactless and non destructive method which has been used a lot to determine thermal properties of different  kind of samples , transverse photothermal deflection PTD in  skimming configuration with ccd camera  and special programs is used to determine thermal conductivity of porous silicon ps  film. Ps samples were prepared by electrochemical etching. Thermal conductivity with porosity changing was measured and the experiments result compared with theoretical results, and they were almost the same.

Keywords

  • Electrochemical etching,
  • Film,
  • Mirage effect,
  • Nano crystalline,
  • Non destructive method,
  • Photothermal deflection PTD,
  • Porous Silicon,
  • Thermal conductivity
HTML