10.7508/ijnd.2014.03.001

An overview of scanning near-field optical microscopy in characterization of nano-materials

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  • Z. Sobat1,
  • S. Sadegh Hassani2,
  1. Catalysis and Nanotechnology Research Division, Research Institute of Petroleum Industry, P. O. Box: 1485733111, Tehran, Iran.
  2. Catalysis and Nanotechnology Research Division, Research Institute of Petroleum Industry, P. O. Box: 1485733111, Tehran, Iran

Published in Issue 2024-02-29

How to Cite

Sobat, Z., & Sadegh Hassani, S. (2024). An overview of scanning near-field optical microscopy in characterization of nano-materials. International Journal of Nano Dimension, 5(3). https://doi.org/10.7508/ijnd.2014.03.001
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Abstract

Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of diverse SNOM methods mostly based on aperture and aperture-less is presented.

Keywords

  • Aperture less SNOM,
  • Nano structures,
  • Optical fiber,
  • Optical microscopy,
  • Photon scanning tunneling microscopy,
  • Scanning Near-Field Optical Microscopy,
  • Scanning probe microscope
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