BOUSSAHA, Ahmed; MAKHLOUFI, Rafik; BENBOUTA, Rachid; BRIOUA, Mourad. Modeling at the nanometric scale of interfacial defects of a semiconductor heterostructure in the isotropic and anisotropic cases for the study of the influence of stresses. Journal of Solid Mechanics, [S. l.], v. 16, n. 1, p. 65–73, 2024. DOI: 10.60664/jsm.2024.3031774. Disponível em: https://oiccpress.com/jsm/article/view/12643. Acesso em: 30 jun. 2026.