OICC Press Journal of Solid Mechanics 2008-7683 13 5 2021 12 30 Anisotropic and Isotropic Elasticity Applied for the Study of Elastic Fields Generated by Interfacial Dislocations in a Heterostructure of InAs/(001)GaAs Semiconductors 503 512 EN R Makhloufi Mechanical Engineering Department, Faculty of Technology, LICEGS Laboratory, University of Batna 2 Mostafa Ben Boulaid, Batna, Algeria A Boussaha Mechanical Engineering Department, Faculty of Technology, University of Batna 2 Mostafa Ben Boulaid, Batna, Algeria R Benbouta Mechanical Engineering Department, Faculty of Technology, LICEGS Laboratory, University of Batna 2 Mostafa Ben Boulaid, Batna, Algeria L Baroura Mechanical Engineering Department, University of Constantine 1, Algeria Journal Article 2021 12 30 This work is a study of the elastic fields’ effect (stresses and displacements) caused by dislocations networks at a heterostructure interface of a InAs / GaAs semiconductors thin system in the cases of isotropic and anisotropic elasticity. The numerical study of this type of heterostructure aims to predict the behavior of the interface with respect to these elastic fields satisfying the boundary conditions. The method used is based on a development in Fourier series. The deformation near the dislocation is greater than the other locations far from the dislocation.