TY - EJOUR
AU - Sayeed, Md. Abu
AU - Rouf, Hasan Khaled
AU - Hussain, Kazi Md. Amjad
PY - 2023
DA - November
TI - Effect of thickness on characteristics of ZnSe thin film synthesized by vacuum thermal evaporation
T2 - Journal of Theoretical and Applied Physics
VL - 14
L1 - https://oiccpress.com/journal-of-theoretical-and-applied-physics/article/effect-of-thickness-on-characteristics-of-znse-thin-film-synthesized-by-vacuum-thermal-evaporation/
DO - 10.1007/s40094-020-00378-1
N2 - AbstractZinc selenide (ZnSe) thin films with various thicknesses were grown on ultrasonically clean glass substrates using vacuum evaporation of 99.99% pure ZnSe powder. Thickness dependence of the structural, optical and electrical properties was thoroughly investigated. X-ray diffraction (XRD) analyses revealed that (110) ZnSe plane is the dominant crystal plane for all the fabricated films. Both dislocation density and micro-strain go down with the increase in film thickness, indicating lower lattice defects and improvement in crystallinity at higher film thickness. Transmittance spectra show that all the films have almost linear upward tendency of transmittance in near-infrared region and small fluctuations in visible region for higher-thickness films. With the increase in film thickness, the optical bandgap increases and also an increasing tendency of dielectric constant was observed. Studies of electrical properties showed a sharp increase in carrier mobility and concentration with film thickness. As the film thickness increases from 30 to 90 nm, the carrier mobility goes up from 255 to 1250 cm2/VS and the carrier concentration increases from 2.14 × 1018 to 9.37 × 1018 cm−3. The electrical transport properties of the deposited thin films were explained in terms of scattering of the charge carrier.
IS - 3
PB - OICC Press
KW - Vacuum thermal evaporation, ZnSe thin film, Ray diffraction, X, Hall effect measurement, UV–Vis–NIR spectrophotometer 
EN -