TY - EJOUR
AU - Rad, Adeleh Granmayeh
AU - Abbasi, Hamed
PY - 2023
DA - November
TI - Optical and morphological characterization of nanostructured AgO thin films
T2 - Journal of Theoretical and Applied Physics
VL - 17
L1 - https://oiccpress.com/journal-of-theoretical-and-applied-physics/article/optical-and-morphological-characterization-of-nanostructured-ago-thin-films/
DO - 10.57647/j.jtap.2023.1701.04
N2 - Silver Oxide (AgO) thin films were prepared by using a cylindrical direct current reactive magnetron sputtering system at 10-5 torr initial pressure on BK7 glass substrate. Samples deposited for 3, 5 and 7 minutes. Surface characterization of AgO thin films in the nanometer scale can be accurately determined using the atomic force microscopy (AFM) and X-ray diffraction (XRD). The average roughness (Ravg), maximum peak to valley height (Rt) and root mean square (Rrms) roughness are used to analyze the surface morphology of AgO films. The linear optical absorption data were measured in the visible-near infrared spectral regions and the nonlinear refractive index (n2) of thin films is evaluated by the moiré deflectometery technique. The investigation indicates that, increase in AgO thickness leads to reduction in nonlinear refractive index.
IS - 1
PB - OICC Press
KW - Moiré deflectometry, Nonlinear refractive index, Optical property, Silver oxide thin film, Surface morphology 
EN -