TY - EJOUR
AU - Sobat, Z.
AU - Hassani, S. Sadegh
PY - 2024
DA - February
TI - An overview of scanning near-field optical microscopy in characterization of nano-materials
T2 - International Journal of Nano Dimension (Int. J. Nano Dimens.)
VL - 5
L1 - https://oiccpress.com/international-journal-of-nano-dimension/article/an-overview-of-scanning-near-field-optical-microscopy-in-characterization-of-nano-materials/
DO - 10.7508/ijnd.2014.03.001
N2 - Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of diverse SNOM methods mostly based on aperture and aperture-less is presented.
IS - 3
PB - OICC Press
KW - Scanning Near-Field Optical Microscopy, Scanning probe microscope, Nano structures, Optical microscopy, Aperture less SNOM, Photon scanning tunneling microscopy, Optical fiber 
EN -