@article{Sobat_Hassani_2024, title={An overview of scanning near-field optical microscopy in characterization of nano-materials}, volume={5}, url={https://oiccpress.com/international-journal-of-nano-dimension/article/an-overview-of-scanning-near-field-optical-microscopy-in-characterization-of-nano-materials/}, DOI={10.7508/ijnd.2014.03.001}, abstractNote={Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of diverse SNOM methods mostly based on aperture and aperture-less is presented.}, number={3}, journal={International Journal of Nano Dimension (Int. J. Nano Dimens.)}, publisher={OICC Press}, author={Sobat, Z. and Hassani, S. Sadegh}, year={2024}, month={Feb.}, keywords={Scanning Near-Field Optical Microscopy, Scanning probe microscope, Nano structures, Optical microscopy, Aperture less SNOM, Photon scanning tunneling microscopy, Optical fiber} }