OICC Press International Nano Letters 2228-5326 6 1 (March 2016) 2015 11 09 Synthesis of polymer nano-brushes by self-seeding method and study of various morphologies by AFM 10.1007/s40089-015-0166-3 EN S. Agbolaghi Institute of Polymeric Materials, Sahand University of Technology, Tabriz, IR Faculty of Polymer Engineering, Sahand University of Technology, Tabriz, IR S. Abbaspoor Institute of Polymeric Materials, Sahand University of Technology, Tabriz, IR Faculty of Polymer Engineering, Sahand University of Technology, Tabriz, IR F. Abbasi Institute of Polymeric Materials, Sahand University of Technology, Tabriz, IR Faculty of Polymer Engineering, Sahand University of Technology, Tabriz, IR Journal Article 2015 11 09 Abstract Polymer brushes due to their high sensitivity to environmental changes are the best and newest means for developing the responsive materials. Polymer nano-brushes consisting various surface morphologies and uniformly distributed amorphous grafted chains were synthesized via single-crystal growth procedure. Poly(ethylene glycol)- b -polystyrene (PEG- b -PS) and poly(ethylene glycol)- b -poly(methyl methacrylate) (PEG- b -PMMA) block copolymers were prepared by atom transfer radical polymerization (ATRP). On the basis of various height differences, phase regions were detectable through atomic force microscopy (AFM NanoscopeIII). The novelty of this work is developing and characterizing the random and intermediate single-co-crystals. Besides, some other sorts of brush-covered single crystals like homo-brush and matrix-dispersed mixed-brushes were involved just for comparing the distinct morphologies. The intermediate (neither matrix-dispersed nor random) single-co-crystals were detectable through their thickness fluctuations in AFM height profiles. On the contrary, the random single-co-crystals were verified through comparing with their corresponding homopolymer and homo-brush single crystals. The growth fronts of (120), (240), (200) and (040) were detected by electron diffraction of transmission electron microscope.